Statistical Process Control: Difference between revisions

Revision as of 15:44, 27 December 2013

Learning Concept(s)	Statistical Process Control (SPC), Control Chart, Natural Variations, Assignable Variations, Xbar-chart, R-chart, Central Limit Theorem, p-chart, c-chart, Run Test, Process Capability, Process Capability Ratio (Cp), Process Capability Index (Cpk), Acceptance Sampling, Operating Characteristic (OC) Curve, Producer's Risk, Consumer's Risk, Acceptable Quality Level (AQL), Lot Tolerance Percentage Defective (LTPD), Type I Error, Type II Error, Average Outgoing Quality (AOQ)
Covered in Course(s)	DCSN200 - Operations Management

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-|Learning Concepts=Statistical Process Control (SPC), Control Chart, Natural Variations, Assignable Variations, x-chart, R-chart, Central Limit Theorem, p-chart, c-chart, Run Test, Process Capability, Cp, Cpk, Acceptance Sampling, Operating Characteristic (OC) Curve, Producer's Risk, Consumer's Risk, Acceptable Quality Level (AQL), Lot Tolerance Percentage Defective (LTPD), Type I Error, Type II Error, Average Outgoing Quality (AOQ)
+|Learning Concepts=Statistical Process Control (SPC), Control Chart, Natural Variations, Assignable Variations, Xbar-chart, R-chart, Central Limit Theorem, p-chart, c-chart, Run Test, Process Capability, Process Capability Ratio (Cp), Process Capability Index (Cpk), Acceptance Sampling, Operating Characteristic (OC) Curve, Producer's Risk, Consumer's Risk, Acceptable Quality Level (AQL), Lot Tolerance Percentage Defective (LTPD), Type I Error, Type II Error, Average Outgoing Quality (AOQ)
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